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"Effects of device aging on microelectronics radiation response and ..."
Daniel M. Fleetwood et al. (2007)
- Daniel M. Fleetwood, M. P. Rodgers, L. Tsetseris, X. J. Zhou, I. Batyrev, S. Wang, Ronald D. Schrimpf, Sokrates T. Pantelides:
Effects of device aging on microelectronics radiation response and reliability. Microelectron. Reliab. 47(7): 1075-1085 (2007)
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