BibTeX record journals/mr/DammannPWBQMMAWMRBBRFS09

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@article{DBLP:journals/mr/DammannPWBQMMAWMRBBRFS09,
  author       = {Maximilian Dammann and
                  W. Pletschen and
                  Patrick Waltereit and
                  Wolfgang Bronner and
                  R{\"{u}}diger Quay and
                  Stefan M{\"{u}}ller and
                  Michael Mikulla and
                  Oliver Ambacher and
                  P. J. van der Wel and
                  S. Murad and
                  T. R{\"{o}}dle and
                  R. Behtash and
                  F. Bourgeois and
                  K. Riepe and
                  Martin Fagerlind and
                  Einar {\"{O}}rn Sveinbj{\"{o}}rnsson},
  title        = {Reliability and degradation mechanism of AlGaN/GaN HEMTs for next
                  generation mobile communication systems},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {5},
  pages        = {474--477},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.02.005},
  doi          = {10.1016/J.MICROREL.2009.02.005},
  timestamp    = {Thu, 14 Oct 2021 09:38:43 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DammannPWBQMMAWMRBBRFS09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}