BibTeX record journals/mr/ChouYWHC11

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@article{DBLP:journals/mr/ChouYWHC11,
  author       = {Tsung{-}Lin Chou and
                  Shin{-}Yueh Yang and
                  Chung{-}Jung Wu and
                  Cheng{-}Nan Han and
                  Kuo{-}Ning Chiang},
  title        = {Measurement and simulation of interfacial adhesion strength between
                  SiO\({}_{\mbox{2}}\) thin film and {III-V} material},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {9-11},
  pages        = {1757--1761},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.06.045},
  doi          = {10.1016/J.MICROREL.2011.06.045},
  timestamp    = {Sun, 02 Oct 2022 15:44:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChouYWHC11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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