BibTeX record journals/mr/ChongCPNTL06

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@article{DBLP:journals/mr/ChongCPNTL06,
  author       = {Desmond Y. R. Chong and
                  F. X. Che and
                  John H. L. Pang and
                  Kellin Ng and
                  Jane Y. N. Tan and
                  Patrick T. H. Low},
  title        = {Drop impact reliability testing for lead-free and lead-based soldered
                  {IC} packages},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {7},
  pages        = {1160--1171},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.10.011},
  doi          = {10.1016/J.MICROREL.2005.10.011},
  timestamp    = {Sat, 30 Sep 2023 10:21:32 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChongCPNTL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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