BibTeX record journals/mr/ChoiBJIWUM16

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@article{DBLP:journals/mr/ChoiBJIWUM16,
  author       = {Ui{-}Min Choi and
                  Frede Blaabjerg and
                  S{\o}ren J{\o}rgensen and
                  Francesco Iannuzzo and
                  Huai Wang and
                  Christian Uhrenfeldt and
                  Stig Munk{-}Nielsen},
  title        = {Power cycling test and failure analysis of molded Intelligent Power
                  {IGBT} Module under different temperature swing durations},
  journal      = {Microelectron. Reliab.},
  volume       = {64},
  pages        = {403--408},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.020},
  doi          = {10.1016/J.MICROREL.2016.07.020},
  timestamp    = {Tue, 07 May 2024 20:21:53 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChoiBJIWUM16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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