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"Power cycling test and failure analysis of molded Intelligent Power IGBT ..."

Ui-Min Choi et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.020

access: closed

type: Journal Article

metadata version: 2023-09-26

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Ui-Min Choi, Frede Blaabjerg, Søren Jørgensen, Francesco Iannuzzo, Huai Wang, Christian Uhrenfeldt, Stig Munk-Nielsen:
Power cycling test and failure analysis of molded Intelligent Power IGBT Module under different temperature swing durations. Microelectron. Reliab. 64: 403-408 (2016)

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