BibTeX record journals/mr/BornBBDGHKLV09

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@article{DBLP:journals/mr/BornBBDGHKLV09,
  author       = {V. Born and
                  M. Beck and
                  O. Bosholm and
                  D. Dalleau and
                  S. Glenz and
                  I. Haverkamp and
                  G. Kurz and
                  F. Lange and
                  Anja Vest},
  title        = {Extended metallization reliability testing: Combining standard wafer
                  level with product tests to increase test sensitivity},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {1},
  pages        = {74--78},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2008.10.017},
  doi          = {10.1016/J.MICROREL.2008.10.017},
  timestamp    = {Tue, 14 Nov 2023 20:02:10 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BornBBDGHKLV09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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