BibTeX record journals/mr/AyalewGPGS03

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@article{DBLP:journals/mr/AyalewGPGS03,
  author       = {Tesfaye Ayalew and
                  Andreas Gehring and
                  Jong Mun Park and
                  Tibor Grasser and
                  Siegfried Selberherr},
  title        = {Improving SiC lateral {DMOSFET} reliability under high field stress},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1889--1894},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00321-4},
  doi          = {10.1016/S0026-2714(03)00321-4},
  timestamp    = {Sat, 22 Feb 2020 19:27:15 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AyalewGPGS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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