BibTeX record journals/mr/AbbateBMSSTV18

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@article{DBLP:journals/mr/AbbateBMSSTV18,
  author       = {Carmine Abbate and
                  Giovanni Busatto and
                  S. Mattiazzo and
                  Annunziata Sanseverino and
                  L. Silvestrin and
                  D. Tedesco and
                  Francesco Velardi},
  title        = {Progressive drain damage in SiC power MOSFETs exposed to ionizing
                  radiation},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {941--945},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.100},
  doi          = {10.1016/J.MICROREL.2018.07.100},
  timestamp    = {Sat, 22 Feb 2020 19:28:18 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AbbateBMSSTV18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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