BibTeX record journals/jei/ParkKLP14

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@article{DBLP:journals/jei/ParkKLP14,
  author       = {Sung{-}Hoon Park and
                  Tai{-}Wook Kim and
                  Jeong{-}Ho Lee and
                  Heui{-}Jae Pahk},
  title        = {Real-time critical dimension measurement of thin film transistor liquid
                  crystal display patterns using optical coherence tomography},
  journal      = {J. Electronic Imaging},
  volume       = {23},
  number       = {1},
  pages        = {013001},
  year         = {2014},
  url          = {https://doi.org/10.1117/1.JEI.23.1.013001},
  doi          = {10.1117/1.JEI.23.1.013001},
  timestamp    = {Sun, 28 May 2017 13:22:37 +0200},
  biburl       = {https://dblp.org/rec/journals/jei/ParkKLP14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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