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BibTeX record journals/iet-cdt/El-MalehK07
@article{DBLP:journals/iet-cdt/El-MalehK07, author = {Aiman El{-}Maleh and S. Saqib Khursheed}, title = {Efficient test compaction for combinational circuits based on Fault detection count-directed clustering}, journal = {{IET} Comput. Digit. Tech.}, volume = {1}, number = {4}, pages = {364--368}, year = {2007}, url = {https://doi.org/10.1049/iet-cdt:20070004}, doi = {10.1049/IET-CDT:20070004}, timestamp = {Thu, 14 Oct 2021 08:51:27 +0200}, biburl = {https://dblp.org/rec/journals/iet-cdt/El-MalehK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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