BibTeX record journals/iet-cdt/El-MalehK07

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@article{DBLP:journals/iet-cdt/El-MalehK07,
  author       = {Aiman El{-}Maleh and
                  S. Saqib Khursheed},
  title        = {Efficient test compaction for combinational circuits based on Fault
                  detection count-directed clustering},
  journal      = {{IET} Comput. Digit. Tech.},
  volume       = {1},
  number       = {4},
  pages        = {364--368},
  year         = {2007},
  url          = {https://doi.org/10.1049/iet-cdt:20070004},
  doi          = {10.1049/IET-CDT:20070004},
  timestamp    = {Thu, 14 Oct 2021 08:51:27 +0200},
  biburl       = {https://dblp.org/rec/journals/iet-cdt/El-MalehK07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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