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"Efficient test compaction for combinational circuits based on Fault ..."

Aiman El-Maleh, S. Saqib Khursheed (2007)

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DOI: 10.1049/IET-CDT:20070004

access: closed

type: Journal Article

metadata version: 2021-10-14

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Aiman El-Maleh, S. Saqib Khursheed:
Efficient test compaction for combinational circuits based on Fault detection count-directed clustering. IET Comput. Digit. Tech. 1(4): 364-368 (2007)

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