BibTeX record journals/ieicet/YabuuchiKK14

download as .bib file

@article{DBLP:journals/ieicet/YabuuchiKK14,
  author       = {Michitarou Yabuuchi and
                  Ryo Kishida and
                  Kazutoshi Kobayashi},
  title        = {Correlations between BTI-Induced Degradations and Process Variations
                  on ASICs and FPGAs},
  journal      = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.},
  volume       = {97-A},
  number       = {12},
  pages        = {2367--2372},
  year         = {2014},
  url          = {https://doi.org/10.1587/transfun.E97.A.2367},
  doi          = {10.1587/TRANSFUN.E97.A.2367},
  timestamp    = {Sat, 11 Apr 2020 13:29:43 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/YabuuchiKK14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.