Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Correlations between BTI-Induced Degradations and Process Variations on ..."

Michitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi (2014)

> Home

Details and statistics

DOI: 10.1587/TRANSFUN.E97.A.2367

access: closed

type: Journal Article

metadata version: 2020-04-11

- view
  authority control:
- export record
  dblp key:
  - journals/ieicet/YabuuchiKK14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ieicet/YabuuchiKK14
Michitarou Yabuuchi, Ryo Kishida, Kazutoshi Kobayashi:
Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 97-A(12): 2367-2372 (2014)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.