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@article{DBLP:journals/ieicet/NakasatoIOF08,
author = {Masato Nakasato and
Michiko Inoue and
Satoshi Ohtake and
Hideo Fujiwara},
title = {Design for Testability Method to Avoid Error Masking of
Software-Based Self-Test for Processors},
journal = {IEICE Transactions},
volume = {91-D},
number = {3},
year = {2008},
pages = {763-770},
ee = {http://dx.doi.org/10.1093/ietisy/e91-d.3.763},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-09-16 by Michael Ley (ley@uni-trier.de)