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"Design for Testability Method to Avoid Error Masking of Software-Based ..."

Masato Nakasato et al. (2008)

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DOI: 10.1093/IETISY/E91-D.3.763

access: closed

type: Journal Article

metadata version: 2020-04-11

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Masato Nakasato, Michiko Inoue, Satoshi Ohtake, Hideo Fujiwara:
Design for Testability Method to Avoid Error Masking of Software-Based Self-Test for Processors. IEICE Trans. Inf. Syst. 91-D(3): 763-770 (2008)

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