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BibTeX record journals/ieicet/MatsukiTMAHKA05
@article{DBLP:journals/ieicet/MatsukiTMAHKA05, author = {Takeo Matsuki and Kazuyoshi Torii and Takeshi Maeda and Yasushi Akasaka and Kiyoshi Hayashi and Naoki Kasai and Tsunetoshi Arikado}, title = {Gate-Last {MISFET} Structures and Process for Characterization of High-k and Metal Gate MISFETs}, journal = {{IEICE} Trans. Electron.}, volume = {88-C}, number = {5}, pages = {804--810}, year = {2005}, url = {https://doi.org/10.1093/ietele/e88-c.5.804}, doi = {10.1093/IETELE/E88-C.5.804}, timestamp = {Sat, 11 Apr 2020 14:47:59 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/MatsukiTMAHKA05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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