BibTeX record journals/ieicet/MatsukiTMAHKA05

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@article{DBLP:journals/ieicet/MatsukiTMAHKA05,
  author       = {Takeo Matsuki and
                  Kazuyoshi Torii and
                  Takeshi Maeda and
                  Yasushi Akasaka and
                  Kiyoshi Hayashi and
                  Naoki Kasai and
                  Tsunetoshi Arikado},
  title        = {Gate-Last {MISFET} Structures and Process for Characterization of
                  High-k and Metal Gate MISFETs},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {88-C},
  number       = {5},
  pages        = {804--810},
  year         = {2005},
  url          = {https://doi.org/10.1093/ietele/e88-c.5.804},
  doi          = {10.1093/IETELE/E88-C.5.804},
  timestamp    = {Sat, 11 Apr 2020 14:47:59 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/MatsukiTMAHKA05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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