default search action
BibTeX record journals/ieicet/HanOSGO14
@article{DBLP:journals/ieicet/HanOSGO14, author = {Dae{-}Hee Han and Shun'ichiro Ohmi and Tomoyuki Suwa and Philippe Gaubert and Tadahiro Ohmi}, title = {Influence of Si Surface Roughness on Electrical Characteristics of {MOSFET} with HfON Gate Insulator Formed by {ECR} Plasma Sputtering}, journal = {{IEICE} Trans. Electron.}, volume = {97-C}, number = {5}, pages = {413--418}, year = {2014}, url = {https://doi.org/10.1587/transele.E97.C.413}, doi = {10.1587/TRANSELE.E97.C.413}, timestamp = {Sat, 11 Apr 2020 14:48:07 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/HanOSGO14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.