BibTeX record journals/ieiceee/KimJCSSS22

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@article{DBLP:journals/ieiceee/KimJCSSS22,
  author       = {Jongwoo Kim and
                  Hyungjun Jo and
                  Yonggyu Cho and
                  Hyunyoung Shim and
                  Jaesung Sim and
                  Hyungcheol Shin},
  title        = {Investigation of endurance degradation for 3-D charge trap {NAND}
                  flash memory with bandgap-engineered tunneling oxide},
  journal      = {{IEICE} Electron. Express},
  volume       = {19},
  number       = {24},
  pages        = {20220465},
  year         = {2022},
  url          = {https://doi.org/10.1587/elex.19.20220465},
  doi          = {10.1587/ELEX.19.20220465},
  timestamp    = {Wed, 15 Feb 2023 22:08:10 +0100},
  biburl       = {https://dblp.org/rec/journals/ieiceee/KimJCSSS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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