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BibTeX record journals/iee-sej/BurgessD84
@article{DBLP:journals/iee-sej/BurgessD84, author = {N. Burgess and Robert I. Damper}, title = {The inadequacy of the stuck-at fault model for testing mos lsi circuits: a review of mos failure mechanisms and some implications for computer-aided design and test of mos lsi circuits}, journal = {Softw. Microsystems}, volume = {3}, number = {2}, pages = {30--36}, year = {1984}, url = {https://doi.org/10.1049/sm.1984.0011}, doi = {10.1049/SM.1984.0011}, timestamp = {Fri, 13 Aug 2021 09:32:48 +0200}, biburl = {https://dblp.org/rec/journals/iee-sej/BurgessD84.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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