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"The inadequacy of the stuck-at fault model for testing mos lsi circuits: a ..."
N. Burgess, Robert I. Damper (1984)
- N. Burgess, Robert I. Damper:
The inadequacy of the stuck-at fault model for testing mos lsi circuits: a review of mos failure mechanisms and some implications for computer-aided design and test of mos lsi circuits. Softw. Microsystems 3(2): 30-36 (1984)

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