BibTeX record journals/et/XuanSC06

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@article{DBLP:journals/et/XuanSC06,
  author       = {Xiangdong Xuan and
                  Adit D. Singh and
                  Abhijit Chatterjee},
  title        = {Lifetime Prediction and Design-for-Reliability of {IC} Interconnections
                  with Electromigration Induced Degradation in the Presence of Manufacturing
                  Defects},
  journal      = {J. Electron. Test.},
  volume       = {22},
  number       = {4-6},
  pages        = {471--482},
  year         = {2006},
  url          = {https://doi.org/10.1007/s10836-006-9498-2},
  doi          = {10.1007/S10836-006-9498-2},
  timestamp    = {Fri, 11 Sep 2020 15:02:47 +0200},
  biburl       = {https://dblp.org/rec/journals/et/XuanSC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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