"Lifetime Prediction and Design-for-Reliability of IC Interconnections with ..."

Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee (2006)

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DOI: 10.1007/S10836-006-9498-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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Xiangdong Xuan, Adit D. Singh, Abhijit Chatterjee:
Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. J. Electron. Test. 22(4-6): 471-482 (2006)

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