BibTeX record journals/et/VoyiatzisPNH96

download as .bib file

@article{DBLP:journals/et/VoyiatzisPNH96,
  author       = {Ioannis Voyiatzis and
                  Antonis M. Paschalis and
                  Dimitris Nikolos and
                  Constantin Halatsis},
  title        = {An efficient built-in self test method for robust path delay fault
                  testing},
  journal      = {J. Electron. Test.},
  volume       = {8},
  number       = {2},
  pages        = {219--222},
  year         = {1996},
  url          = {https://doi.org/10.1007/BF02341826},
  doi          = {10.1007/BF02341826},
  timestamp    = {Mon, 26 Oct 2020 08:48:44 +0100},
  biburl       = {https://dblp.org/rec/journals/et/VoyiatzisPNH96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.