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"An efficient built-in self test method for robust path delay fault testing."
Ioannis Voyiatzis et al. (1996)
- Ioannis Voyiatzis, Antonis M. Paschalis
, Dimitris Nikolos, Constantin Halatsis:
An efficient built-in self test method for robust path delay fault testing. J. Electron. Test. 8(2): 219-222 (1996)
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