BibTeX record journals/et/JenaBD21

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@article{DBLP:journals/et/JenaBD21,
  author       = {Sisir Kumar Jena and
                  Santosh Biswas and
                  Jatindra Kumar Deka},
  title        = {Retesting Defective Circuits to Allow Acceptable Faults for Yield
                  Enhancement},
  journal      = {J. Electron. Test.},
  volume       = {37},
  number       = {5},
  pages        = {633--652},
  year         = {2021},
  url          = {https://doi.org/10.1007/s10836-021-05980-y},
  doi          = {10.1007/S10836-021-05980-Y},
  timestamp    = {Wed, 23 Feb 2022 11:16:44 +0100},
  biburl       = {https://dblp.org/rec/journals/et/JenaBD21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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