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"Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement."
Sisir Kumar Jena, Santosh Biswas, Jatindra Kumar Deka (2021)
- Sisir Kumar Jena, Santosh Biswas, Jatindra Kumar Deka:
Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement. J. Electron. Test. 37(5): 633-652 (2021)
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