@article{DBLP:journals/et/HilscherBRLG09,
author = {Martin Hilscher and
Michael Braun and
Michael Richter and
Andreas Leininger and
Michael G{\"o}ssel},
title = {X-tolerant Test Data Compaction with Accelerated Shift Registers},
journal = {J. Electronic Testing},
volume = {25},
number = {4-5},
year = {2009},
pages = {247-258},
ee = {http://dx.doi.org/10.1007/s10836-009-5107-5},
bibsource = {DBLP, http://dblp.uni-trier.de}
}