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"X-tolerant Test Data Compaction with Accelerated Shift Registers."
Martin Hilscher et al. (2009)
- Martin Hilscher, Michael Braun, Michael Richter, Andreas Leininger, Michael Gössel:
X-tolerant Test Data Compaction with Accelerated Shift Registers. J. Electron. Test. 25(4-5): 247-258 (2009)
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