HaberlK95'

BibTeX

@article{DBLP:journals/et/HaberlK95,
  author    = {Oliver F. Haberl and
               Thomas Kropf},
  title     = {HIST: A hierarchical self test methodology for chips, boards,
               and systems},
  journal   = {J. Electronic Testing},
  volume    = {6},
  number    = {1},
  year      = {1995},
  pages     = {85-106},
  ee        = {http://dx.doi.org/10.1007/BF00993132},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}