BibTeX record journals/et/HaberlK95

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@article{DBLP:journals/et/HaberlK95,
  author       = {Oliver F. Haberl and
                  Thomas Kropf},
  title        = {{HIST:} {A} hierarchical self test methodology for chips, boards,
                  and systems},
  journal      = {J. Electron. Test.},
  volume       = {6},
  number       = {1},
  pages        = {85--106},
  year         = {1995},
  url          = {https://doi.org/10.1007/BF00993132},
  doi          = {10.1007/BF00993132},
  timestamp    = {Fri, 11 Sep 2020 15:02:16 +0200},
  biburl       = {https://dblp.org/rec/journals/et/HaberlK95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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