"HIST: A hierarchical self test methodology for chips, boards, and systems."

Oliver F. Haberl, Thomas Kropf (1995)

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DOI: 10.1007/BF00993132

access: closed

type: Journal Article

metadata version: 2020-09-11

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Oliver F. Haberl, Thomas Kropf:
HIST: A hierarchical self test methodology for chips, boards, and systems. J. Electron. Test. 6(1): 85-106 (1995)

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