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BibTeX record journals/et/ChakravartyGV96
@article{DBLP:journals/et/ChakravartyGV96, author = {Sreejit Chakravarty and Yiming Gong and Srikanth Venkataraman}, title = {Diagnostic simulation of stuck-at faults in combinational circuits}, journal = {J. Electron. Test.}, volume = {8}, number = {1}, pages = {87--97}, year = {1996}, url = {https://doi.org/10.1007/BF00136078}, doi = {10.1007/BF00136078}, timestamp = {Fri, 11 Sep 2020 15:03:09 +0200}, biburl = {https://dblp.org/rec/journals/et/ChakravartyGV96.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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