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"Diagnostic simulation of stuck-at faults in combinational circuits."

Sreejit Chakravarty, Yiming Gong, Srikanth Venkataraman (1996)

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DOI: 10.1007/BF00136078

access: closed

type: Journal Article

metadata version: 2020-09-11

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  dblp key:
  - journals/et/ChakravartyGV96
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  persistent URL:
  - https://dblp.org/rec/journals/et/ChakravartyGV96
Sreejit Chakravarty, Yiming Gong, Srikanth Venkataraman:
Diagnostic simulation of stuck-at faults in combinational circuits. J. Electron. Test. 8(1): 87-97 (1996)

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