BibTeX record journals/cii/LeeKCBPOK23

download as .bib file

@article{DBLP:journals/cii/LeeKCBPOK23,
  author       = {Dong{-}Hee Lee and
                  Eun{-}Su Kim and
                  Seung{-}Hyun Choi and
                  Young{-}Mok Bae and
                  Jong{-}Bum Park and
                  Young{-}Chan Oh and
                  Kwang{-}Jae Kim},
  title        = {Development of taxonomy for classifying defect patterns on wafer bin
                  map using Bin2Vec and clustering methods},
  journal      = {Comput. Ind.},
  volume       = {152},
  pages        = {104005},
  year         = {2023},
  url          = {https://doi.org/10.1016/j.compind.2023.104005},
  doi          = {10.1016/J.COMPIND.2023.104005},
  timestamp    = {Wed, 20 Sep 2023 23:28:51 +0200},
  biburl       = {https://dblp.org/rec/journals/cii/LeeKCBPOK23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.