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"Development of taxonomy for classifying defect patterns on wafer bin map ..."
Dong-Hee Lee et al. (2023)
- Dong-Hee Lee, Eun-Su Kim, Seung-Hyun Choi, Young-Mok Bae, Jong-Bum Park, Young-Chan Oh, Kwang-Jae Kim:
Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods. Comput. Ind. 152: 104005 (2023)
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