BibTeX record journals/candie/ChienNLC23

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@article{DBLP:journals/candie/ChienNLC23,
  author       = {Chen{-}Fu Chien and
                  Tran Hong Van Nguyen and
                  Yi{-}Chiu Li and
                  Ying{-}Jen Chen},
  title        = {Bayesian decision analysis for optimizing in-line metrology and defect
                  inspection strategy for sustainable semiconductor manufacturing and
                  an empirical study},
  journal      = {Comput. Ind. Eng.},
  volume       = {182},
  pages        = {109421},
  year         = {2023},
  url          = {https://doi.org/10.1016/j.cie.2023.109421},
  doi          = {10.1016/J.CIE.2023.109421},
  timestamp    = {Sat, 30 Sep 2023 10:04:47 +0200},
  biburl       = {https://dblp.org/rec/journals/candie/ChienNLC23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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