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BibTeX record journals/access/JeongYLB20
@article{DBLP:journals/access/JeongYLB20, author = {Jinsu Jeong and Jun{-}Sik Yoon and Seunghwan Lee and Rock{-}Hyun Baek}, title = {Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application}, journal = {{IEEE} Access}, volume = {8}, pages = {35873--35881}, year = {2020}, url = {https://doi.org/10.1109/ACCESS.2020.2975017}, doi = {10.1109/ACCESS.2020.2975017}, timestamp = {Thu, 19 Mar 2020 10:22:27 +0100}, biburl = {https://dblp.org/rec/journals/access/JeongYLB20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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