BibTeX record conf/vts/XuYP21

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@inproceedings{DBLP:conf/vts/XuYP21,
  author       = {Kangkang Xu and
                  Yang Yu and
                  Xiyuan Peng},
  title        = {{TSV} Fault Modeling and {A} {BIST} Solution for {TSV} Pre-bond Test},
  booktitle    = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA,
                  April 25-28, 2021},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/VTS50974.2021.9441058},
  doi          = {10.1109/VTS50974.2021.9441058},
  timestamp    = {Mon, 05 Feb 2024 20:29:48 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/XuYP21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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