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BibTeX record conf/vts/XuYP21
@inproceedings{DBLP:conf/vts/XuYP21, author = {Kangkang Xu and Yang Yu and Xiyuan Peng}, title = {{TSV} Fault Modeling and {A} {BIST} Solution for {TSV} Pre-bond Test}, booktitle = {39th {IEEE} {VLSI} Test Symposium, {VTS} 2021, San Diego, CA, USA, April 25-28, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/VTS50974.2021.9441058}, doi = {10.1109/VTS50974.2021.9441058}, timestamp = {Mon, 05 Feb 2024 20:29:48 +0100}, biburl = {https://dblp.org/rec/conf/vts/XuYP21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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