BibTeX record conf/vts/StroudT98

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@inproceedings{DBLP:conf/vts/StroudT98,
  author       = {Charles E. Stroud and
                  Joe K. Tannehill Jr.},
  title        = {Applying Built-In Self-Test to Majority Voting Fault Tolerant Circuits},
  booktitle    = {16th {IEEE} {VLSI} Test Symposium {(VTS} '98), 28 April - 1 May 1998,
                  Princeton, NJ, {USA}},
  pages        = {303--308},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/VTEST.1998.670884},
  doi          = {10.1109/VTEST.1998.670884},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/StroudT98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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