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"Applying Built-In Self-Test to Majority Voting Fault Tolerant Circuits."

Charles E. Stroud, Joe K. Tannehill Jr. (1998)

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DOI: 10.1109/VTEST.1998.670884

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  persistent URL:
  - https://dblp.org/rec/conf/vts/StroudT98
Charles E. Stroud, Joe K. Tannehill Jr.:
Applying Built-In Self-Test to Majority Voting Fault Tolerant Circuits. VTS 1998: 303-308

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