BibTeX record conf/vts/HiraideBKIEYM03

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@inproceedings{DBLP:conf/vts/HiraideBKIEYM03,
  author       = {Takahisa Hiraide and
                  Kwame Osei Boateng and
                  Hideaki Konishi and
                  Koichi Itaya and
                  Michiaki Emori and
                  Hitoshi Yamanaka and
                  Takashi Mochiyama},
  title        = {BIST-Aided Scan Test - {A} New Method for Test Cost Reduction},
  booktitle    = {21st {IEEE} {VLSI} Test Symposium {(VTS} 2003), 27 April - 1 May 2003,
                  Napa Valley, CA, {USA}},
  pages        = {359--364},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/VTEST.2003.1197675},
  doi          = {10.1109/VTEST.2003.1197675},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/HiraideBKIEYM03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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