"BIST-Aided Scan Test - A New Method for Test Cost Reduction."

Takahisa Hiraide et al. (2003)

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DOI: 10.1109/VTEST.2003.1197675

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama:
BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS 2003: 359-364

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