BibTeX record conf/vts/GhukasyanTHZ23

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@inproceedings{DBLP:conf/vts/GhukasyanTHZ23,
  author       = {Artur Ghukasyan and
                  Grigor Tshagharyan and
                  Gurgen Harutyunyan and
                  Yervant Zorian},
  title        = {Overcoming Embedded Memory Test {\&} Repair Challenges in the
                  Gate-All-Around Era},
  booktitle    = {41st {IEEE} {VLSI} Test Symposium, {VTS} 2023, San Diego, CA, USA,
                  April 24-26, 2023},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/VTS56346.2023.10140110},
  doi          = {10.1109/VTS56346.2023.10140110},
  timestamp    = {Fri, 09 Jun 2023 15:18:15 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/GhukasyanTHZ23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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