BibTeX record conf/vts/AnghelNA00

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@inproceedings{DBLP:conf/vts/AnghelNA00,
  author       = {Lorena Anghel and
                  Michael Nicolaidis and
                  Issam Alzaher{-}Noufal},
  title        = {Self-Checking Circuits versus Realistic Faults in Very Deep Submicron},
  booktitle    = {18th {IEEE} {VLSI} Test Symposium {(VTS} 2000), 30 April - 4 May 2000,
                  Montreal, Canada},
  pages        = {55--66},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/VTEST.2000.843827},
  doi          = {10.1109/VTEST.2000.843827},
  timestamp    = {Mon, 26 Jun 2023 20:47:12 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/AnghelNA00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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