"Self-Checking Circuits versus Realistic Faults in Very Deep Submicron."

Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal (2000)

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DOI: 10.1109/VTEST.2000.843827

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal:
Self-Checking Circuits versus Realistic Faults in Very Deep Submicron. VTS 2000: 55-66

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