BibTeX record conf/vlsit/ShankerWCLCHMS22

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@inproceedings{DBLP:conf/vlsit/ShankerWCLCHMS22,
  author       = {Nirmaan Shanker and
                  Li{-}Chen Wang and
                  Suraj S. Cheema and
                  Wenshen Li and
                  Nilotpal Choudhury and
                  Chenming Hu and
                  Souvik Mahapatra and
                  Sayeef S. Salahuddin},
  title        = {On the {PBTI} Reliability of Low {EOT} Negative Capacitance 1.8 nm
                  HfO2-ZrO2 Superlattice Gate Stack on Lg=90 nm nFETs},
  booktitle    = {{IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
                  and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
  pages        = {421--422},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830440},
  doi          = {10.1109/VLSITECHNOLOGYANDCIR46769.2022.9830440},
  timestamp    = {Wed, 16 Aug 2023 09:30:49 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsit/ShankerWCLCHMS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}