BibTeX record conf/vlsit/KoPBJSKLJLLPKKJ23

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@inproceedings{DBLP:conf/vlsit/KoPBJSKLJLLPKKJ23,
  author       = {S. Ko and
                  J. H. Park and
                  J. H. Bak and
                  H. Jung and
                  J. Shim and
                  D. S. Kim and
                  W. Lim and
                  D.{-}E. Jeong and
                  J. H. Lee and
                  K. Lee and
                  J.{-}H. Park and
                  Y. Kim and
                  C. Kim and
                  J. H. Jeong and
                  C. Y. Lee and
                  S. H. Han and
                  Y. Ji and
                  S. H. Hwang and
                  Hye Ji Shin and
                  K. Lee and
                  Y. J. Song and
                  Yu{-}Gyun Shin and
                  J. H. Song},
  title        = {Highly Reliable and Manufacturable {MRAM} embedded in 14nm FinFET
                  node},
  booktitle    = {2023 {IEEE} Symposium on {VLSI} Technology and Circuits {(VLSI} Technology
                  and Circuits), Kyoto, Japan, June 11-16, 2023},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185248},
  doi          = {10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185248},
  timestamp    = {Mon, 08 Jul 2024 08:23:15 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsit/KoPBJSKLJLLPKKJ23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}