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"Highly Reliable and Manufacturable MRAM embedded in 14nm FinFET node."

S. Ko et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185248

access: closed

type: Conference or Workshop Paper

metadata version: 2024-07-08

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  dblp key:
  - conf/vlsit/KoPBJSKLJLLPKKJ23
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  - https://dblp.org/rec/conf/vlsit/KoPBJSKLJLLPKKJ23
S. Ko, J. H. Park, J. H. Bak, H. Jung, J. Shim, D. S. Kim, W. Lim, D.-E. Jeong, J. H. Lee, K. Lee, J.-H. Park, Y. Kim, C. Kim, J. H. Jeong, C. Y. Lee, S. H. Han, Y. Ji, S. H. Hwang, Hye Ji Shin, K. Lee, Y. J. Song, Yu-Gyun Shin, J. H. Song:
Highly Reliable and Manufacturable MRAM embedded in 14nm FinFET node. VLSI Technology and Circuits 2023: 1-2

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