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BibTeX record conf/vlsid/OjhaPM16
@inproceedings{DBLP:conf/vlsid/OjhaPM16, author = {Apoorva Ojha and Narendra Parihar and Nihar R. Mohapatra}, title = {Analysis and Modeling of Stress over Layer Induced Threshold Voltage Shift in {HKMG} nMOS Transistors}, booktitle = {29th International Conference on {VLSI} Design and 15th International Conference on Embedded Systems, {VLSID} 2016, Kolkata, India, January 4-8, 2016}, pages = {323--327}, publisher = {{IEEE} Computer Society}, year = {2016}, url = {https://doi.org/10.1109/VLSID.2016.20}, doi = {10.1109/VLSID.2016.20}, timestamp = {Fri, 24 Mar 2023 00:03:59 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/OjhaPM16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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