"Analysis and Modeling of Stress over Layer Induced Threshold Voltage Shift ..."

Apoorva Ojha, Narendra Parihar, Nihar R. Mohapatra (2016)

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DOI: 10.1109/VLSID.2016.20

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Apoorva Ojha, Narendra Parihar, Nihar R. Mohapatra:
Analysis and Modeling of Stress over Layer Induced Threshold Voltage Shift in HKMG nMOS Transistors. VLSID 2016: 323-327

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